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Books by Martin C. Schubert

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  • - Basics and Use for Evaluating Electronic Devices and Materials
    by Otwin Breitenstein, Wilhelm Warta & Martin C. Schubert
    £134.99

    This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

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