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Books by University of Illinois) Nelson

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  • - Statistical Models, Test Plans, and Data Analysis
    by Wayne B. (California Institute of Technology (Caltech) & University of Illinois) Nelson
    £116.49

    Useful methodology has been developed in accelerated testing. This work deals with the topic Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. It is useful for practitioners.

  • by Wayne B. (California Institute of Technology (Caltech) & University of Illinois) Nelson
    £116.49

    WILEY--INTERSCIENCE PAPERBACK SERIES The Wiley--Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation.

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