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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction
- Binding:
- Hardback
- Pages:
- 348
- Published:
- August 31, 2010
- Dimensions:
- 175x254x20 mm.
- Weight:
- 768 g.
Delivery:
2-4 weeks
Expected delivery: December 21, 2024
Extended return policy to January 30, 2025
About Rolf (Swiss Federal Labs For Materials Science
View all books by Rolf (Swiss Federal Labs For Materials ScienceDescription of Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction
Presents an introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. This book addresses advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science.
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