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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

- A User-Oriented Guide

About Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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  • Language:
  • English
  • ISBN:
  • 9783642273803
  • Binding:
  • Hardback
  • Pages:
  • 528
  • Published:
  • October 24, 2012
  • Edition:
  • 2013
  • Dimensions:
  • 161x241x34 mm.
  • Weight:
  • 940 g.
Delivery: 2-3 weeks
Expected delivery: January 11, 2025
Extended return policy to January 30, 2025
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Description of Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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