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Cluster Secondary Ion Mass Spectrometry
- Principles and Applications
part of the Wiley Series on Mass Spectrometry series
- Binding:
- Hardback
- Pages:
- 368
- Published:
- June 27, 2013
- Dimensions:
- 243x165x21 mm.
- Weight:
- 762 g.
Delivery:
2-4 weeks
Expected delivery: December 20, 2024
Description of Cluster Secondary Ion Mass Spectrometry
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.
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