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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
part of the MRS Proceedings series
- Binding:
- Hardback
- Pages:
- 194
- Published:
- November 18, 2009
- Dimensions:
- 160x236x14 mm.
- Weight:
- 430 g.
Delivery:
2-3 weeks
Expected delivery: January 11, 2025
Extended return policy to January 30, 2025
Description of CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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