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CMOS RF Circuit Design for Reliability and Variability
part of the SpringerBriefs in Reliability series
part of the SpringerBriefs in Applied Sciences and Technology series
- Binding:
- Paperback
- Pages:
- 106
- Published:
- April 20, 2016
- Edition:
- 12016
- Dimensions:
- 155x235x6 mm.
- Weight:
- 1825 g.
Delivery:
2-4 weeks
Expected delivery: December 19, 2024
Description of CMOS RF Circuit Design for Reliability and Variability
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.
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