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Conductive Atomic Force Microscopy
- Applications in Nanomaterials
- Binding:
- Hardback
- Pages:
- 384
- Published:
- October 10, 2017
- Dimensions:
- 251x176x25 mm.
- Weight:
- 978 g.
Delivery:
2-4 weeks
Expected delivery: August 13, 2025
Description of Conductive Atomic Force Microscopy
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
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