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Electrical Atomic Force Microscopy for Nanoelectronics
part of the NanoScience and Technology series
- Binding:
- Paperback
- Pages:
- 408
- Published:
- August 24, 2020
- Edition:
- 12019
- Dimensions:
- 155x235x0 mm.
- Weight:
- 652 g.
Delivery:
2-4 weeks
Expected delivery: December 26, 2024
Extended return policy to January 30, 2025
Description of Electrical Atomic Force Microscopy for Nanoelectronics
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.
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