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Electromigration in Thin Films and Electronic Devices

- Materials and Reliability

part of the Woodhead Publishing Series in Electronic and Optical Materials series

Electromigration in Thin Films and Electronic Devices
  • Language:
  • English
  • ISBN:
  • 9780081016961
  • Binding:
  • Paperback
  • Pages:
  • 352
  • Published:
  • August 18, 2016
  • Weight:
  • 500 g.
Delivery: 1-2 weeks
Expected delivery: July 17, 2025

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