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About Electromigration In Ulsi Interconnections

Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

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  • Language:
  • English
  • ISBN:
  • 9789814273329
  • Binding:
  • Hardback
  • Pages:
  • 312
  • Published:
  • August 24, 2010
  • Dimensions:
  • 229x155x23 mm.
Delivery: 2-4 weeks
Expected delivery: December 18, 2024

Description of Electromigration In Ulsi Interconnections

Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

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