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Fringe Pattern Analysis for Optical Metrology

- Theory, Algorithms, and Applications

About Fringe Pattern Analysis for Optical Metrology

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.

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  • Language:
  • English
  • ISBN:
  • 9783527411528
  • Binding:
  • Hardback
  • Pages:
  • 344
  • Published:
  • July 1, 2014
  • Dimensions:
  • 175x250x22 mm.
  • Weight:
  • 898 g.
Delivery: 2-4 weeks
Expected delivery: August 15, 2025

Description of Fringe Pattern Analysis for Optical Metrology

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.

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