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Introduction to Spectroscopic Ellipsometry of Thin Film Materials
- Instrumentation, Data Analysis and Applications
- Binding:
- Paperback
- Pages:
- 208
- Published:
- April 12, 2022
- Dimensions:
- 246x173x11 mm.
- Weight:
- 414 g.
Delivery:
2-4 weeks
Expected delivery: December 19, 2024
About Andrew T. S. (National University of Singapore Wee
View all books by Andrew T. S. (National University of Singapore WeeDescription of Introduction to Spectroscopic Ellipsometry of Thin Film Materials
Dieses Buch ist eine aktualisierte Einführung in die Anwendung der spektrometrischen Ellipsometrie mit ihrem praktischen Einsatz bei der Untersuchung von Grenzflächeneigenschaften, Elektronenstrukturen und Quasiteilcheneigenschaften verschiedener Klassen von Dünnschichtmaterialien.
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