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Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
part of the IOP Concise Physics series
- Binding:
- Paperback
- Pages:
- 66
- Published:
- October 15, 2015
- Dimensions:
- 256x177x8 mm.
- Weight:
- 192 g.
Delivery:
1-2 weeks
Expected delivery: December 13, 2024
Extended return policy to January 30, 2025
Description of Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.
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