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Investigation of Gate Current in Neutron Irradiated Alxga1-Xn/Gan Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence
- Binding:
- Paperback
- Pages:
- 128
- Published:
- November 15, 2012
- Dimensions:
- 189x246x7 mm.
- Weight:
- 240 g.
Delivery:
1-2 weeks
Expected delivery: August 17, 2025
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