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Lifetime Spectroscopy
- A Method of Defect Characterization in Silicon for Photovoltaic Applications
part of the Springer Series in Materials Science series
- Language:
- English
- ISBN:
- 9783540253037
- Binding:
- Hardback
- Pages:
- 492
- Published:
- June 22, 2005
- Edition:
- 2005
- Dimensions:
- 241x166x37 mm.
- Weight:
- 950 g.
Delivery:
2-3 weeks
Expected delivery: December 19, 2024
Extended return policy to January 30, 2025
Description of Lifetime Spectroscopy
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.
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