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Metal Impurities in Silicon- and Germanium-Based Technologies
- Origin, Characterization, Control, and Device Impact
part of the Springer Series in Materials Science series
- Binding:
- Paperback
- Pages:
- 438
- Published:
- January 29, 2019
- Edition:
- 12018
- Dimensions:
- 155x235x0 mm.
- Weight:
- 718 g.
Delivery:
1-2 weeks
Expected delivery: December 11, 2024
Description of Metal Impurities in Silicon- and Germanium-Based Technologies
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
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