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Microscopy of Semiconducting Materials

- 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK

About Microscopy of Semiconducting Materials

Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

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  • Language:
  • English
  • ISBN:
  • 9780750306508
  • Binding:
  • Hardback
  • Pages:
  • 772
  • Published:
  • December 31, 1999
  • Dimensions:
  • 156x234x41 mm.
  • Weight:
  • 1428 g.
Delivery: 2-3 weeks
Expected delivery: April 19, 2025

Description of Microscopy of Semiconducting Materials

Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

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