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Nanoscale Redox Reaction at Metal/Oxide Interface

- A Case Study on Schottky Contact and ReRAM

About Nanoscale Redox Reaction at Metal/Oxide Interface

Oxide materials are good candidates for replacing Si devices, which are increasingly reaching their performance limits, since the former offer a range of unique properties, due to their composition, design and/or doping techniques.

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  • Language:
  • English
  • ISBN:
  • 9784431548492
  • Binding:
  • Paperback
  • Pages:
  • 89
  • Published:
  • May 21, 2020
  • Edition:
  • 12020
  • Dimensions:
  • 155x235x0 mm.
  • Weight:
  • 454 g.
Delivery: 1-2 weeks
Expected delivery: January 4, 2025
Extended return policy to January 30, 2025
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Description of Nanoscale Redox Reaction at Metal/Oxide Interface

Oxide materials are good candidates for replacing Si devices, which are increasingly reaching their performance limits, since the former offer a range of unique properties, due to their composition, design and/or doping techniques.

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