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Quantitative Data Processing in Scanning Probe Microscopy
- SPM Applications for Nanometrology
part of the Micro & Nano Technologies series
- Binding:
- Hardback
- Pages:
- 336
- Published:
- November 18, 2012
- Dimensions:
- 191x235x25 mm.
- Weight:
- 800 g.
Delivery:
2-3 weeks
Expected delivery: March 9, 2025
About Petr (Czech Metrology Institute) Klapetek
View all books by Petr (Czech Metrology Institute) KlapetekDescription of Quantitative Data Processing in Scanning Probe Microscopy
Provides readers with a number of worked examples to demonstrate typical ways of solving problems in Scanning Probe Microscopy (SPM) analysis. This title uses the advanced research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences.
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