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Radiation-induced Soft Error
- A Chip-level Modeling
- Binding:
- Paperback
- Pages:
- 136
- Published:
- November 26, 2010
- Dimensions:
- 157x234x8 mm.
- Weight:
- 210 g.
Delivery:
1-2 weeks
Expected delivery: November 29, 2024
Description of Radiation-induced Soft Error
A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.
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