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Reliability Wearout Mechanisms in Advanced CMOS Technologies
- Binding:
- Hardback
- Pages:
- 640
- Published:
- September 3, 2009
- Dimensions:
- 164x243x34 mm.
- Weight:
- 993 g.
Delivery:
2-4 weeks
Expected delivery: January 25, 2025
Extended return policy to January 30, 2025
Description of Reliability Wearout Mechanisms in Advanced CMOS Technologies
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
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