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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors

About RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors

This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures.

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  • Language:
  • English
  • ISBN:
  • 9783030777746
  • Binding:
  • Hardback
  • Pages:
  • 168
  • Published:
  • December 15, 2021
  • Edition:
  • 12022
  • Dimensions:
  • 155x235x0 mm.
  • Weight:
  • 442 g.
Delivery: 2-4 weeks
Expected delivery: January 24, 2025
Extended return policy to January 30, 2025
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Description of RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors

This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures.

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