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Scanning Electron Microscopy and X-Ray Microanalysis
- Third Edition
- Binding:
- Hardback
- Pages:
- 689
- Published:
- January 30, 2003
- Edition:
- 32003
- Dimensions:
- 178x255x38 mm.
- Weight:
- 1684 g.
Delivery:
2-4 weeks
Expected delivery: July 27, 2025
Description of Scanning Electron Microscopy and X-Ray Microanalysis
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
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