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Scanning Electron Microscopy
- Physics of Image Formation and Microanalysis
part of the Springer Series in Optical Sciences series
- Language:
- English
- ISBN:
- 9783540639763
- Binding:
- Hardback
- Pages:
- 529
- Published:
- September 16, 1998
- Edition:
- 21998
- Dimensions:
- 242x166x34 mm.
- Weight:
- 954 g.
Delivery:
2-3 weeks
Expected delivery: January 10, 2025
Extended return policy to January 30, 2025
Description of Scanning Electron Microscopy
The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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