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Secondary Ion Mass Spectrometry SIMS II
- Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979
part of the Springer Series in Chemical Physics series
- Language:
- English
- ISBN:
- 9783642618734
- Binding:
- Paperback
- Pages:
- 300
- Published:
- December 12, 2011
- Edition:
- 11979
- Dimensions:
- 152x229x17 mm.
- Weight:
- 466 g.
Delivery:
1-2 weeks
Expected delivery: January 2, 2025
Extended return policy to January 30, 2025
Description of Secondary Ion Mass Spectrometry SIMS II
This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.
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