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Semiconductor Material and Device Characterization
part of the Wiley - IEEE series
part of the IEEE Press series
- Binding:
- Hardback
- Pages:
- 800
- Published:
- February 16, 2006
- Edition:
- 3
- Dimensions:
- 243x164x51 mm.
- Weight:
- 1324 g.
Delivery:
2-4 weeks
Expected delivery: December 19, 2024
About Dieter K. (Arizona State University) Schroder
View all books by Dieter K. (Arizona State University) SchroderDescription of Semiconductor Material and Device Characterization
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.
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