Join thousands of book lovers
Sign up to our newsletter and receive discounts and inspiration for your next reading experience.
By signing up, you agree to our Privacy Policy.You can, at any time, unsubscribe from our newsletters.
Soft Error Reliability of VLSI Circuits
- Analysis and Mitigation Techniques
- Binding:
- Hardback
- Pages:
- 114
- Published:
- October 13, 2020
- Edition:
- 12021
- Dimensions:
- 155x235x0 mm.
- Weight:
- 454 g.
Delivery:
2-3 weeks
Expected delivery: January 15, 2025
Description of Soft Error Reliability of VLSI Circuits
Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
User ratings of Soft Error Reliability of VLSI Circuits
Rate this book
In order to rate this book you must be logged in.Others also bought..
Find similar books
The book Soft Error Reliability of VLSI Circuits can be found in the following categories:
You can, at any time, unsubscribe from our newsletters.
© 2024 Tales
All packages are shipped from our warehouse in the UK.
Company address: Esromgade 15, 3. - 2200 - DK
Registered company number: DK43351621
