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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
part of the Devices, Circuits, and Systems series
- Binding:
- Hardback
- Pages:
- 259
- Published:
- October 24, 2013
- Dimensions:
- 175x238x22 mm.
- Weight:
- 598 g.
Delivery:
2-4 weeks
Expected delivery: December 20, 2024
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