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The Measurement of Intelligence - An Explanation of and a Complete Guide for the Use of the Stanford Revision and Extension of the Binet-Simon Intelligence Scale

About The Measurement of Intelligence - An Explanation of and a Complete Guide for the Use of the Stanford Revision and Extension of the Binet-Simon Intelligence Scale

The constant and growing use of the Binet-Simon intelligence scale in public schools, institutions for defectives, reform schools, juvenile courts, and police courts is sufficient evidence of the intrinsic worth of the method. It is generally recognized, however, that the serviceableness of the scale has hitherto been seriously limited, both by the lack of a sufficiently detailed guide and by a number of recognized imperfections in the scale itself. The Stanford revision and extension has been worked out for the purpose of correcting as many as possible of these imperfections, and it is here presented with a rather minute description of the method as a whole and of the individual tests.

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  • Language:
  • English
  • ISBN:
  • 9781805479338
  • Binding:
  • Paperback
  • Pages:
  • 298
  • Published:
  • April 12, 2023
  • Dimensions:
  • 216x17x280 mm.
  • Weight:
  • 755 g.
Delivery: 1-2 weeks
Expected delivery: January 4, 2025
Extended return policy to January 30, 2025
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Description of The Measurement of Intelligence - An Explanation of and a Complete Guide for the Use of the Stanford Revision and Extension of the Binet-Simon Intelligence Scale

The constant and growing use of the Binet-Simon intelligence scale in public schools, institutions for defectives, reform schools, juvenile courts, and police courts is sufficient evidence of the intrinsic worth of the method.
It is generally recognized, however, that the serviceableness of the scale has hitherto been seriously limited, both by the lack of a sufficiently detailed guide and by a number of recognized imperfections in the scale itself. The Stanford revision and extension has been worked out for the purpose of correcting as many as possible of these imperfections, and it is here presented with a rather minute description of the method as a whole and of the individual tests.

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