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Transmission Electron Microscopy in Micro-nanoelectronics

About Transmission Electron Microscopy in Micro-nanoelectronics

Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs.

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  • Language:
  • English
  • ISBN:
  • 9781848213678
  • Binding:
  • Hardback
  • Pages:
  • 264
  • Published:
  • December 17, 2012
  • Dimensions:
  • 240x162x23 mm.
  • Weight:
  • 592 g.
Delivery: 2-4 weeks
Expected delivery: February 15, 2025

Description of Transmission Electron Microscopy in Micro-nanoelectronics

Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs.

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