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X-ray Scattering From Semiconductors (2nd Edition)
- Binding:
- Hardback
- Pages:
- 316
- Published:
- July 7, 2003
- Edition:
- 2
- Dimensions:
- 230x154x24 mm.
Delivery:
2-4 weeks
Expected delivery: December 21, 2024
Extended return policy to January 30, 2025
Description of X-ray Scattering From Semiconductors (2nd Edition)
A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.
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