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Electromigration Inside Logic Cells
- Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
- Binding:
- Paperback
- Pages:
- 118
- Published:
- July 4, 2018
- Edition:
- 12017
- Dimensions:
- 155x235x0 mm.
- Weight:
- 454 g.
Delivery:
1-2 weeks
Expected delivery: December 8, 2024
Description of Electromigration Inside Logic Cells
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.
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