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Fundamentals of Electromigration-Aware Integrated Circuit Design

About Fundamentals of Electromigration-Aware Integrated Circuit Design

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.

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  • Language:
  • English
  • ISBN:
  • 9783319735573
  • Binding:
  • Hardback
  • Pages:
  • 159
  • Published:
  • March 7, 2018
  • Edition:
  • 12018
  • Dimensions:
  • 241x166x12 mm.
  • Weight:
  • 434 g.
  In stock
Delivery: 3-5 business days
Expected delivery: October 12, 2024

Description of Fundamentals of Electromigration-Aware Integrated Circuit Design

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.

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