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Helium Ion Microscopy

part of the NanoScience and Technology series

Helium Ion Microscopy
About Helium Ion Microscopy

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.

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  • Language:
  • English
  • ISBN:
  • 9783319824734
  • Binding:
  • Paperback
  • Pages:
  • 526
  • Published:
  • June 15, 2018
  • Edition:
  • 12016
  • Dimensions:
  • 155x235x0 mm.
  • Weight:
  • 836 g.
Delivery: 1-2 weeks
Expected delivery: January 4, 2025
Extended return policy to January 30, 2025
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Description of Helium Ion Microscopy

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.

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