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Helium Ion Microscopy

About Helium Ion Microscopy

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.

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  • Language:
  • English
  • ISBN:
  • 9783319824734
  • Binding:
  • Paperback
  • Pages:
  • 526
  • Published:
  • June 15, 2018
  • Edition:
  • 12016
  • Dimensions:
  • 155x235x0 mm.
  • Weight:
  • 836 g.
Delivery: 1-2 weeks
Expected delivery: December 5, 2024

Description of Helium Ion Microscopy

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.

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