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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
- Binding:
- Paperback
- Pages:
- 278
- Published:
- October 20, 2024
- Dimensions:
- 156x234x0 mm.
- Weight:
- 512 g.
Delivery:
1-2 weeks
Expected delivery: December 6, 2024
Description of On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.
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