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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
- Binding:
- Hardback
- Pages:
- 278
- Published:
- July 30, 2019
- Dimensions:
- 156x234x0 mm.
- Weight:
- 526 g.
Delivery:
2-3 weeks
Expected delivery: December 12, 2024
Description of On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
Presents solutions for accurate mm-wave characterization of advanced semiconductor devices. The book guides readers through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.
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