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Physical Principles of Electron Microscopy
- An Introduction to TEM, SEM, and AEM
- Binding:
- Paperback
- Pages:
- 196
- Published:
- May 29, 2018
- Edition:
- 22016
- Dimensions:
- 234x156x16 mm.
- Weight:
- 334 g.
Delivery:
1-2 weeks
Expected delivery: May 9, 2025
Description of Physical Principles of Electron Microscopy
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
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