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Statistical Analysis of Profile Monitoring

About Statistical Analysis of Profile Monitoring

* This is the first book of its kind on the subject. It is written by experts in the field (such as J.D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). It is current and presents state-of-the-art materials.

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  • Language:
  • English
  • ISBN:
  • 9780470903223
  • Binding:
  • Hardback
  • Pages:
  • 332
  • Published:
  • September 1, 2011
  • Dimensions:
  • 164x245x22 mm.
  • Weight:
  • 632 g.
Delivery: 2-4 weeks
Expected delivery: November 29, 2024

Description of Statistical Analysis of Profile Monitoring

* This is the first book of its kind on the subject. It is written by experts in the field (such as J.D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). It is current and presents state-of-the-art materials.

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